Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm

Abstract

Testing an RF device in Production is expensive and technically difficult. At Wafer Test level, the RF probing technologies hardly fulfil the industrial test requirements in terms of accuracy, reliability and cost. At Package test level testing the RF parameters requires expensive RF equipments (RF automated test equipments (ATE)) and for complex RF transceivers, which address multi-modes (RF multi-paths and/or requiring different impedance matchings), it usually leads to prohibitive test time.