Modeling and Statistical Characterization of Electromagnetic Coupling to Electronic Devices

James D. Hunter, Shengxuan Xia, Aaron Harmon, Ahmed Hassan, V. Khilkevich, D. Beetner
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引用次数: 2

Abstract

The electromagnetic susceptibility of electronic devices varies substantially from one device to another. The objective of the following study is to better understand the statistical variation in coupling to printed circuit boards (PCBs) and their attached cables, and thus their susceptibility. Models are being developed to estimate coupling to wiring harnesses and PCB traces. The voltage coupled depends on the frequency, angle of arrival, and polarization of the incident wave, as well as the characteristics of the receiving structure. The statistical characteristics of the coupled voltage with variations in the arrival angle, polarization and typical variations in the receiving structure (e.g. length of wiring harness, size of connector, board size, trace location, etc.) are being found through simulations. These variations in coupling were used to predict the frequency content of the incident wave that is most likely to cause an over voltage or current within the studied parameter space. Existing models explore differential mode coupling to traces and common-mode coupling to harnesses. Differential mode models of the harness and connectors are under development. These and the previous modeling blocks ultimately create a “toolbox” with which estimate the statistical variation in coupling to a variety of devices.
电子设备电磁耦合的建模与统计特性
电子设备的电磁敏感性在不同的设备之间有很大的不同。以下研究的目的是为了更好地了解耦合到印刷电路板(pcb)及其附加电缆的统计变化,从而了解它们的敏感性。正在开发模型来估计与线束和PCB走线的耦合。耦合电压取决于入射波的频率、入射角、极化以及接收结构的特性。通过仿真得到了耦合电压随到达角、极化变化的统计特性以及接收结构(如线束长度、连接器尺寸、电路板尺寸、走线位置等)的典型变化。这些耦合的变化被用来预测在研究的参数空间内最可能引起过电压或电流的入射波的频率含量。现有模型探索差分模式耦合到走线和共模耦合到线束。线束和连接器的差分模式模型正在开发中。这些和前面的建模模块最终创建了一个“工具箱”,用它来估计与各种设备耦合的统计变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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