Power-dependence measurement of the quality factor of superconducting microwave resonators at mK temperature

S. Kim, Dong-Gwang Ha, Gwanyeol Park, Jiman Choi, J. Park, Woon Song, Soon-Gul Lee, H. Im, Hyungsang Kim, Y. Chong
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引用次数: 3

Abstract

We report our setup and measurement results of the quality factor Q of superconducting microwave resonators at mK temperature in a dilution refrigerator. The power dependence of the superconducting resonators' Q was measured down to the single photon level. Measurements were performed on two types of microwave resonators. First, a half-wavelength coplanar waveguide (CPW) resonator made of niobium film on an oxidized high-resistivity silicon substrate was measured. Then a rectangular box resonator made of machined superconducting aluminum alloy was measured. While the CPW chip resonator's Q value showed noticeable decrease at low microwave power, the box resonator's Q showed little power dependence. This setup is intended to perform characterization of various microwave resonators, which will serve as key components in superconducting qubit in circuit QED architecture.
mK温度下超导微波谐振器品质因数的功率依赖性测量
本文报道了超导微波谐振器在mK温度下的质量因子Q的设置和测量结果。在单光子水平下测量了超导谐振器Q的功率依赖性。对两种类型的微波谐振器进行了测量。首先,在氧化高阻硅衬底上测量了由铌薄膜制成的半波长共面波导(CPW)谐振腔。然后对用机械超导铝合金制成的矩形盒谐振器进行了测量。CPW片式谐振器的Q值在低微波功率下有明显的下降,盒式谐振器的Q值对功率的依赖性较小。该装置旨在对各种微波谐振器进行表征,这些谐振器将作为电路QED结构中超导量子比特的关键部件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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