{"title":"RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)","authors":"A. Gebregiorgis, Artemis Zografou, S. Hamdioui","doi":"10.1109/ETS54262.2022.9810414","DOIUrl":null,"url":null,"abstract":"Computation-In Memory (CIM) using RRAM crossbar array is a promising solution to realize energy-efficient neuromorphic hardware, such as Binary Neural Networks (BNNs). However, RRAM faults restrict the applicability of CIM for BNN implementation. To address this issue, we propose a fault tolerance framework to mitigate the impact of RRAM faults on the accuracy of CIM-based BNN hardware. Evaluation results using MNIST, Fashion-MNIST and CIFAR-10 datasets demonstrate that the proposed framework outperforms the related works as it restores more than 99% of the RRAM fault induced accuracy reduction with relatively less overhead.","PeriodicalId":334931,"journal":{"name":"2022 IEEE European Test Symposium (ETS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS54262.2022.9810414","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Computation-In Memory (CIM) using RRAM crossbar array is a promising solution to realize energy-efficient neuromorphic hardware, such as Binary Neural Networks (BNNs). However, RRAM faults restrict the applicability of CIM for BNN implementation. To address this issue, we propose a fault tolerance framework to mitigate the impact of RRAM faults on the accuracy of CIM-based BNN hardware. Evaluation results using MNIST, Fashion-MNIST and CIFAR-10 datasets demonstrate that the proposed framework outperforms the related works as it restores more than 99% of the RRAM fault induced accuracy reduction with relatively less overhead.