Progress of instrumentation and measurement toward millimeter-wave photonics

International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301) Pub Date : 1999-11-17 DOI:10.1109/MWP.1999.819659

T. Nagatsuma

引用次数: 19

Abstract

This paper will review the latest of several instrumentation and measurement technologies in millimeter-wave photonics, especially using 1.3/1.55-/spl mu/m-wavelength-based techniques. Progress of key technology and state-of-the-art system applications will be described.

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毫米波光子学仪器与测量研究进展

本文综述了毫米波光子学的几种最新仪器和测量技术，特别是基于1.3/1.55-/spl mu/m波长的技术。将介绍关键技术的进展和最先进的系统应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301)

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