{"title":"Nonlinear transmission line as a large signal model for HEMT","authors":"Byung-sung Kim, Sangwook Nam","doi":"10.1109/EUMA.1996.337568","DOIUrl":null,"url":null,"abstract":"This paper presents a new large signal modeling technique for FET devices. The proposed method employs distributed approach using nonlinear transmission line based on GCA(Gradual Channel Approximation). The modeling procedure needs only a few S parameter measurements under cold bias condition and simple I-V measurements. The former is used to extract the channel conductance and gate capacitance and the latter to optimize the velocity-field relation. The large signal model can be directly established without any active biased S parameter measurements, ECP extraction, and laborious fitting procedures required in conventional empirical modelings.","PeriodicalId":219101,"journal":{"name":"1996 26th European Microwave Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 26th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1996.337568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a new large signal modeling technique for FET devices. The proposed method employs distributed approach using nonlinear transmission line based on GCA(Gradual Channel Approximation). The modeling procedure needs only a few S parameter measurements under cold bias condition and simple I-V measurements. The former is used to extract the channel conductance and gate capacitance and the latter to optimize the velocity-field relation. The large signal model can be directly established without any active biased S parameter measurements, ECP extraction, and laborious fitting procedures required in conventional empirical modelings.