Dielectric Breakdown Between PV Panel Frames and Structures – A Hypothesis

P. H. Pretorius
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Abstract

Flash marks on the frames of some photovoltaic panels suggested that these may be associated with arcing phenomena that may contribute to interference and loss of efficiency of the panels. The question of how these flash marks were presented was raised. A hypothesis is proposed in this paper that the flash marks are as a result of loss of equipotential on a micro-scale, under lightning ground potential rise, and as a result of the difference in impedance between the materials of the panel frames and the structures, sufficient potential difference developed between the materials that lead to the dielectric breakdown of the aluminium oxide layer on the panel frame.
光伏板框架和结构之间的介电击穿-一个假设
一些光伏板框架上的闪光痕迹表明,这些闪光痕迹可能与电弧现象有关,这种电弧现象可能导致电池板的干扰和效率损失。人们提出了这些闪光痕迹是如何出现的问题。本文提出了一种假设,即闪痕是由于雷电地电位上升下微尺度等电位损失的结果,以及由于面板框架材料和结构之间的阻抗差异,材料之间产生了足够的电位差,导致面板框架上氧化铝层的介电击穿。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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