{"title":"Dielectric Breakdown Between PV Panel Frames and Structures – A Hypothesis","authors":"P. H. Pretorius","doi":"10.1109/GEMCCON.2018.8628580","DOIUrl":null,"url":null,"abstract":"Flash marks on the frames of some photovoltaic panels suggested that these may be associated with arcing phenomena that may contribute to interference and loss of efficiency of the panels. The question of how these flash marks were presented was raised. A hypothesis is proposed in this paper that the flash marks are as a result of loss of equipotential on a micro-scale, under lightning ground potential rise, and as a result of the difference in impedance between the materials of the panel frames and the structures, sufficient potential difference developed between the materials that lead to the dielectric breakdown of the aluminium oxide layer on the panel frame.","PeriodicalId":394870,"journal":{"name":"2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GEMCCON.2018.8628580","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Flash marks on the frames of some photovoltaic panels suggested that these may be associated with arcing phenomena that may contribute to interference and loss of efficiency of the panels. The question of how these flash marks were presented was raised. A hypothesis is proposed in this paper that the flash marks are as a result of loss of equipotential on a micro-scale, under lightning ground potential rise, and as a result of the difference in impedance between the materials of the panel frames and the structures, sufficient potential difference developed between the materials that lead to the dielectric breakdown of the aluminium oxide layer on the panel frame.