Analyzing relationship between the number of errors in review and debug processes for embedded software development projects

Toyoshiro Nakashima, K. Iwata, Yoshiyuki Anan, N. Ishii
{"title":"Analyzing relationship between the number of errors in review and debug processes for embedded software development projects","authors":"Toyoshiro Nakashima, K. Iwata, Yoshiyuki Anan, N. Ishii","doi":"10.1109/ICIS.2013.6607874","DOIUrl":null,"url":null,"abstract":"In this study, we examine the effect of reviewing processes for embedded software development projects. We analyze the relationship between review processes and debugging process using the Shapiro-Wilk test and Spearman's rank correlation coefficient. The results indicate that the data selected was not from a normally distributed population and that review processes can reduce the number of development errors.","PeriodicalId":345020,"journal":{"name":"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIS.2013.6607874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this study, we examine the effect of reviewing processes for embedded software development projects. We analyze the relationship between review processes and debugging process using the Shapiro-Wilk test and Spearman's rank correlation coefficient. The results indicate that the data selected was not from a normally distributed population and that review processes can reduce the number of development errors.
分析嵌入式软件开发项目评审和调试过程中错误数量的关系
在本研究中,我们考察了对嵌入式软件开发项目的评审过程的影响。我们使用Shapiro-Wilk检验和Spearman等级相关系数分析了评审过程和调试过程之间的关系。结果表明,所选择的数据不是来自正态分布的总体,并且审查过程可以减少开发错误的数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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