{"title":"Development of measuring equipment for active optoelectronic components","authors":"V.I. Osinsky, A. Voronko, P.A. Merzhvinsky","doi":"10.1109/CRMICO.2001.961666","DOIUrl":null,"url":null,"abstract":"The result of development of a measuring complex of optoelectronic devices for fiber-optic communication devices is represented. Due to the intensive development of the optical telecommunication, the measurement problem of optoelectronic components for transceivers is of great practical importance. This paper reports on the development of effective measuring equipment for active components of transceiver modules at designing, testing and production stages. The control operations and measuring parameters are described.","PeriodicalId":197471,"journal":{"name":"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"11th International Conference 'Microwave and Telecommunication Technology'. Conference Proceedings (IEEE Cat. No.01EX487)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2001.961666","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The result of development of a measuring complex of optoelectronic devices for fiber-optic communication devices is represented. Due to the intensive development of the optical telecommunication, the measurement problem of optoelectronic components for transceivers is of great practical importance. This paper reports on the development of effective measuring equipment for active components of transceiver modules at designing, testing and production stages. The control operations and measuring parameters are described.