High-performance analogue measurement using internal enhanced PWM and ADC of a DSP-chip

O. Martens, M. Min, H. Trampark, A. Liimets
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引用次数: 2

Abstract

Modern control-oriented and general-purpose low- cost digital signal processor (DSP) chips include multiple 16-bit pulse-width modulators (PWM), in some cases with enhanced 8- bit part with possibility to adjust the PWM in fractions of the digital clock ("micro-steps"). Such PWM work at clock frequencies of 100 MHz and higher and can be used as a precise digital-to-analog converters (DAC). Such DSP chips also include multichannel (multiplexed) analog-to-digital converter ADC, of up to 12-bits resolution, working at conversion rate of up to 10 MHz. So, combining these resources together, with few extra components, high-performance analog-to-digital conversion is possible. In the current paper possibility of achieving of up to 20-bit resolution and measurement of frequencies of frequencies to tens of kHz or even more - is proposed, investigated and discussed. A PWM is used as the DAC in the compensation feedback path of the total analog-to-digital conversion path.
采用dsp芯片内部增强型PWM和ADC的高性能模拟测量
现代面向控制和通用的低成本数字信号处理器(DSP)芯片包括多个16位脉宽调制器(PWM),在某些情况下具有增强的8位部分,可以在数字时钟的部分(“微步”)中调整PWM。这种PWM工作在100mhz或更高的时钟频率下,可以用作精确的数模转换器(DAC)。这种DSP芯片还包括多通道(多路复用)模数转换器ADC,分辨率高达12位,转换率高达10 MHz。因此,将这些资源结合在一起,只需要很少的额外组件,就可以实现高性能的模数转换。本文提出、研究和讨论了实现高达20位分辨率和测量频率到几十千赫甚至更高频率的可能性。在整个模数转换路径的补偿反馈路径中,采用PWM作为DAC。
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