F. Nallet, A. Sénès, D. Planson, M. Locatelli, J. Chante, J.P. Taboy
{"title":"Electrical and electrothermal 2D simulations of a 4H-SiC high voltage current limiting device for serial protection applications","authors":"F. Nallet, A. Sénès, D. Planson, M. Locatelli, J. Chante, J.P. Taboy","doi":"10.1109/IPEMC.2000.885436","DOIUrl":null,"url":null,"abstract":"The subject of this paper is a study of the ability of silicon carbide to be used for new solid state power device applications. A 4H-SiC current limiting device is studied. The device structure is a vertical power MOSFET with a preformed N channel. Its electrothermal behavior is presented through simulations with ISE TCAD tools. The efficiency of such a silicon device is estimated for comparison with SiC. A full simulation with two SiC devices inside an HSPICE modeled circuit is also proposed to study the ability of a bi-directional serial protection system.","PeriodicalId":373820,"journal":{"name":"Proceedings IPEMC 2000. Third International Power Electronics and Motion Control Conference (IEEE Cat. No.00EX435)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IPEMC 2000. Third International Power Electronics and Motion Control Conference (IEEE Cat. No.00EX435)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPEMC.2000.885436","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The subject of this paper is a study of the ability of silicon carbide to be used for new solid state power device applications. A 4H-SiC current limiting device is studied. The device structure is a vertical power MOSFET with a preformed N channel. Its electrothermal behavior is presented through simulations with ISE TCAD tools. The efficiency of such a silicon device is estimated for comparison with SiC. A full simulation with two SiC devices inside an HSPICE modeled circuit is also proposed to study the ability of a bi-directional serial protection system.