Post-silicon validation of the IBM POWER8 processor

Amir Nahir, Manoj Dusanapudi, Shakti Kapoor, K. Reick, W. Roesner, Klaus-Dieter Schubert, Keith Sharp, Greg Wetli
{"title":"Post-silicon validation of the IBM POWER8 processor","authors":"Amir Nahir, Manoj Dusanapudi, Shakti Kapoor, K. Reick, W. Roesner, Klaus-Dieter Schubert, Keith Sharp, Greg Wetli","doi":"10.1145/2593069.2593183","DOIUrl":null,"url":null,"abstract":"The post-silicon validation phase in a processor's design life cycle is geared towards finding all remaining bugs in the system. It is, in fact, our last opportunity to find functional and electrical bugs in the design before shipping it to customers. In this paper, we provide a high-level overview of the methodology and technologies put into use as part of the POWER8 post-silicon functional validation phase. We describe the results and list the primary factors that contributed to this highly successful bring-up.","PeriodicalId":433816,"journal":{"name":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2593069.2593183","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

Abstract

The post-silicon validation phase in a processor's design life cycle is geared towards finding all remaining bugs in the system. It is, in fact, our last opportunity to find functional and electrical bugs in the design before shipping it to customers. In this paper, we provide a high-level overview of the methodology and technologies put into use as part of the POWER8 post-silicon functional validation phase. We describe the results and list the primary factors that contributed to this highly successful bring-up.
IBM POWER8处理器的硅后验证
处理器设计生命周期中的后硅验证阶段旨在发现系统中所有剩余的错误。事实上,这是我们在交付给客户之前发现设计中功能和电气缺陷的最后机会。在本文中,我们提供了作为POWER8后硅功能验证阶段的一部分而投入使用的方法和技术的高级概述。我们描述了结果,并列出了促成这种非常成功的教养的主要因素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信