Jason Adams, James Tucker, David Angeles, Tabytha Perez, T. Buchheit, Shahed Reza
{"title":"Characterizing Electrical Device Behavior with Functional Tolerance Bounds.","authors":"Jason Adams, James Tucker, David Angeles, Tabytha Perez, T. Buchheit, Shahed Reza","doi":"10.2172/1888652","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":259665,"journal":{"name":"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proposed for presentation at the Mechanistic Machine Learning and Digital Twins for Computaional Science, Engineering, and Technology held September 26-29, 2021 in San Diego, CA US","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2172/1888652","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}