Design of Concurrent Error Detection Techniques for FFT implemented on FPGA platform

Kv Mohan Krishna, K. Sarawadekar
{"title":"Design of Concurrent Error Detection Techniques for FFT implemented on FPGA platform","authors":"Kv Mohan Krishna, K. Sarawadekar","doi":"10.1109/INDICON52576.2021.9691593","DOIUrl":null,"url":null,"abstract":"Fast Fourier Transform (FFT) is one of the popular techniques in digital signal processing applications. By use of FFT, we get the advantage of reduction in number of computations required over the traditional Discrete Fourier Transform (DFT). When implementing the complex FFT in SRAM based FPGA’s the major challenge is the soft errors. Soft errors leads to the modification of configuration memory bits which results in alteration of mapped circuit. For detecting the alteration of configuration memory bits in FPGAs, concurrent error detection(CED) techniques are used. Dual Modular Redundancy (DMR) is the most popular technique used for error detection whereas in-case of FFT, Parseval Sum of Squares (SoS) is the preferred technique for error detection. Analysis of these techniques show that DMR and SoS have good error detection capabilities but at cost of high resource usage. By utilizing some of the properties of FFT, it is possible to detect soft errors. These properties are nothing but form of input and output relations and involves less number of complex multiplications and additions which gives advantage of less resource usage. The proposed techniques along with DMR and FFT are implemented on FPGA and their resource usage is compared. Results show that proposed techniques required much less resources. Also the proposed techniques are tested for their error detection capabilities by injecting faults at FFT outputs.","PeriodicalId":106004,"journal":{"name":"2021 IEEE 18th India Council International Conference (INDICON)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 18th India Council International Conference (INDICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDICON52576.2021.9691593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Fast Fourier Transform (FFT) is one of the popular techniques in digital signal processing applications. By use of FFT, we get the advantage of reduction in number of computations required over the traditional Discrete Fourier Transform (DFT). When implementing the complex FFT in SRAM based FPGA’s the major challenge is the soft errors. Soft errors leads to the modification of configuration memory bits which results in alteration of mapped circuit. For detecting the alteration of configuration memory bits in FPGAs, concurrent error detection(CED) techniques are used. Dual Modular Redundancy (DMR) is the most popular technique used for error detection whereas in-case of FFT, Parseval Sum of Squares (SoS) is the preferred technique for error detection. Analysis of these techniques show that DMR and SoS have good error detection capabilities but at cost of high resource usage. By utilizing some of the properties of FFT, it is possible to detect soft errors. These properties are nothing but form of input and output relations and involves less number of complex multiplications and additions which gives advantage of less resource usage. The proposed techniques along with DMR and FFT are implemented on FPGA and their resource usage is compared. Results show that proposed techniques required much less resources. Also the proposed techniques are tested for their error detection capabilities by injecting faults at FFT outputs.
基于FPGA平台的FFT并发错误检测技术设计
快速傅里叶变换(FFT)是数字信号处理中应用最广泛的技术之一。与传统的离散傅立叶变换(DFT)相比,使用FFT可以减少所需的计算量。在基于SRAM的FPGA中实现复杂的FFT时,主要的挑战是软误差。软错误导致组态存储器位的修改,从而导致映射电路的改变。为了检测fpga中组态存储器位的改变,采用了并发错误检测(CED)技术。双模冗余(DMR)是最常用的错误检测技术,而在FFT的情况下,Parseval平方和(so)是错误检测的首选技术。对这些技术的分析表明,DMR和SoS具有良好的错误检测能力,但代价是资源占用较高。通过利用FFT的一些特性,可以检测到软错误。这些属性只不过是输入和输出关系的形式,并且涉及较少数量的复杂乘法和加法,从而提供较少资源使用的优势。在FPGA上实现了该技术以及DMR和FFT,并比较了它们的资源使用情况。结果表明,所提出的技术所需的资源要少得多。此外,通过在FFT输出中注入故障,测试了所提出的技术的错误检测能力。
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