Fail-safe switching-cells architectures based on monolithic on-chip fuse

Amirouche Oumaziz, E. Sarraute, F. Richardeau, A. Bourennane
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引用次数: 1

Abstract

In this work, we propose a new concept of fail-safe switching cells based on the use of integrated fuses. These fuses allow the circuit to be partially isolated and reconfigured, which therefore becomes fault tolerant and prevents total shut down. We focused our work on the design and 3D simulation by finite elements method of monolithic fuses integrated on silicon substrate, taking into account static and dynamic specifications. Thermal management in steady state is improved by dielectric epoxy thermal insulation under each constriction of the fuse. Implementation and preliminary practical tests at medium voltage are reported. The effect of a coating using silicone gel around the fuses is analyzed to improve the cut-off capability.
基于单片熔断器的故障安全开关单元结构
在这项工作中,我们提出了一种基于使用集成保险丝的故障安全开关单元的新概念。这些熔断器允许电路部分隔离和重新配置,因此具有容错性并防止完全关闭。本文重点研究了集成在硅衬底上的单片熔断器的设计和三维有限元仿真,同时考虑了其静态和动态特性。在熔断器的每次收缩下,通过介电环氧树脂隔热来改善稳定状态下的热管理。报道了在中压条件下的实现和初步实际试验。分析了在熔断器外涂硅凝胶以提高熔断器的切断能力的效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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