Lily Huang, Michael R. Smith, Albert Tran, James Miller
{"title":"E-RACE, A Hardware-Assisted Approach to Lockset-Based Data Race Detection for Embedded Products","authors":"Lily Huang, Michael R. Smith, Albert Tran, James Miller","doi":"10.1109/ISSRE.2008.23","DOIUrl":null,"url":null,"abstract":"Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.","PeriodicalId":448275,"journal":{"name":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 19th International Symposium on Software Reliability Engineering (ISSRE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSRE.2008.23","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Limited research exists for identifying data races under the specific characteristics found in embedded systems. E-RACE is a new style of data-race identification tool which directly utilizes specialized hardware capabilities to monitor the flow of data and instructions. Compared to existing data race analysis approaches, the hardware-assisted E-RACE tool has advantages of recognizing data-race issues without requiring extensive software code instrumentation. The tool is integrated into an Embedded Unit Testing Driven Development Framework to encourage the construction of testable code and early identification of data-races.