{"title":"Validation of reactive embedded systems against temporal requirements","authors":"J. Strug, S. Deniziak, K. Sapiecha","doi":"10.1109/ECBS.2004.1316694","DOIUrl":null,"url":null,"abstract":"Efficient methods of automatic generation of test scenarios to validate a system against functional requirements have already been developed. However, there are no such satisfactory methods as far as temporal requirements are concerned. A method of automatic generation of test scenarios for verification of time constraints for reactive embedded systems is presented.","PeriodicalId":137219,"journal":{"name":"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECBS.2004.1316694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Efficient methods of automatic generation of test scenarios to validate a system against functional requirements have already been developed. However, there are no such satisfactory methods as far as temporal requirements are concerned. A method of automatic generation of test scenarios for verification of time constraints for reactive embedded systems is presented.