M. Momtazpour, Jinghe Zhang, S. Rahman, Ratnesh K. Sharma, Naren Ramakrishnan
{"title":"Analyzing Invariants in Cyber-Physical Systems using Latent Factor Regression","authors":"M. Momtazpour, Jinghe Zhang, S. Rahman, Ratnesh K. Sharma, Naren Ramakrishnan","doi":"10.1145/2783258.2788605","DOIUrl":null,"url":null,"abstract":"The analysis of large scale data logged from complex cyber-physical systems, such as microgrids, often entails the discovery of invariants capturing functional as well as operational relationships underlying such large systems. We describe a latent factor approach to infer invariants underlying system variables and how we can leverage these relationships to monitor a cyber-physical system. In particular we illustrate how this approach helps rapidly identify outliers during system operation.","PeriodicalId":243428,"journal":{"name":"Proceedings of the 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2783258.2788605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
The analysis of large scale data logged from complex cyber-physical systems, such as microgrids, often entails the discovery of invariants capturing functional as well as operational relationships underlying such large systems. We describe a latent factor approach to infer invariants underlying system variables and how we can leverage these relationships to monitor a cyber-physical system. In particular we illustrate how this approach helps rapidly identify outliers during system operation.