Long-term stability of UV multifilter rotating shadowband radiometers

SPIE Optics + Photonics Pub Date : 2003-11-06 DOI:10.1117/12.508195

G. Janson, J. Slusser

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引用次数: 4

Abstract

This is a continuation of work begun by Dave Bigelow and James Slusser in their study of the same name published in 2000 in J. Geophys. Res., 105, 4833-4840. This continuation study began in January 2002, when the entire database for the UV Multifilter Rotating Shadowband Radiometers (UV-MFRSR) was analyzed using the Langley regression technique, as described in "Langley Method of Calibrating UV Filter Radiometers," Slusser et. al., 2000, J. Geophys. Res., 105, 4841-4849. In conjunction with scientists at ASRC, SUNY, Albany (New York), the UVMRP has refined the air mass range versus wavelength that is used in the Langley analysis methodology to conform to the greater optical depths in the UV (290)-380 nm) compared with the visible (400-965 nm). A time series of direct Sun voltage intercepts (Vo's) from Langley plots is an indication of stability, which augments the traditional periodic standard lamp calibrations. Overall, 129 cases representing 28 sites and 39 instruments, with 21 sites and 30 instruments having multiple cases, were studied. The results presented herein show the mean annual drift in sensitivity for the seven nominal wavelengths of the UV-MFRSR instrument are: 300 nm - 1.2%, 305 nm - 4.8%, 311 nm - 2.6%, 317 nm - 3.0%, 325 nm - 4.8%, 332 nm - 4.9%, 368 nm - 3.7%.

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紫外多滤光旋转阴影带辐射计的长期稳定性

这是Dave Bigelow和James Slusser在2000年《J. Geophys》上发表的同名研究的延续。Res. 105, 4833-4840。这一延续研究开始于2002年1月，当时使用Langley回归技术对UV- mfrsr的整个数据库进行了分析，如Slusser et. al.， 2000, J. Geophys中所描述的“校准UV滤光辐射计的Langley方法”。Res.， 105, 4841-4849。与ASRC, SUNY, Albany (New York)的科学家合作，UVMRP已经改进了用于Langley分析方法的气团范围与波长，以符合与可见光(400-965 nm)相比，紫外(290)-380 nm的更大光学深度。来自兰利图的直接太阳电压截距(Vo’s)的时间序列是稳定性的指示，它增加了传统的周期性标准灯校准。总共研究了28个地点和39种仪器的129例病例，其中21个地点和30种仪器有多例病例。结果表明，紫外- mfrsr仪器7个标称波长的灵敏度年平均漂移量分别为:300 nm - 1.2%、305 nm - 4.8%、311 nm - 2.6%、317 nm - 3.0%、325 nm - 4.8%、332 nm - 4.9%、368 nm - 3.7%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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SPIE Optics + Photonics

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