Signature analysis based IC diagnostics-a statistician's perspective

C.K. Lakshminarayan, S. Pabbisetty, C. Han
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Abstract

This paper deals with the basic concepts of signature analysis, and will attempt to demonstrate how its implementation would enable efficient utilization of failure analysis engineering resources to analyze field failures and avoid repetitive analyses. This would accomplish the dual objective of improved customer satisfaction and reduced cycle time. Signature analysis methodology can be used in Failure Analysis, Design, Product, and Customer Quality and Reliability Engineering group applications. Starting with definitions, purpose, and various possible scenarios, a formal mathematical framework is developed for computing sample sizes and establishing confidence levels when the failures occur at random or occur in clusters.
基于IC诊断的签名分析——统计学家的观点
本文涉及特征分析的基本概念,并将尝试演示其实现如何能够有效利用失效分析工程资源来分析现场故障并避免重复分析。这将实现提高客户满意度和缩短周期时间的双重目标。签名分析方法可用于失效分析、设计、产品、客户质量和可靠性工程组应用。从定义、目的和各种可能的场景开始,开发了一个正式的数学框架,用于计算样本大小,并在故障随机发生或发生在集群中时建立置信水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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