Extended Combination Testing: Generates Array Test Suite

Xiaodong Xie, Yansheng Lu
{"title":"Extended Combination Testing: Generates Array Test Suite","authors":"Xiaodong Xie, Yansheng Lu","doi":"10.1109/ISPA.2009.55","DOIUrl":null,"url":null,"abstract":"Traditional testing methods tend to generate test suite for programs of which parameters are basic data types, e.g. integer, real or Boolean. However, there are lots of programs with inputs of complex data types, e.g. array, point or structure, traditional testing methods can’t deal with them. This paper focuses on testing programs with array parameter that is widely used in programming. The difficulties to generate array test suite lie in two reasons. The first reason is that array is composed by several ordered, interactional elements. Thus, we cannot take the array as several independent, isolated elements when generating array test suite. The second one is that we should consider the implicative attributes of array effecting the generation of test suite, e.g. the size of array, or some special elements in array. This paper proposes a new testing method, Extended Combination Testing (ECT), to generate array test suite systemically. Through based on traditional combination testing, ECT extends its application scope form basic data test suite generation to array test suite generation. ECT proceeds in three steps: (1) yield values of other non-array parameters and spawn them to a proper combination; (2) identify the implicative attributes of array; (3) choose values for each array elements, and combine values of array elements with proper combination coverage into test suite. While in traditional combination test, only step (3) is included. The results of our experiment validate the effectiveness of ECT in generating array test suite.","PeriodicalId":346815,"journal":{"name":"2009 IEEE International Symposium on Parallel and Distributed Processing with Applications","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Symposium on Parallel and Distributed Processing with Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPA.2009.55","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Traditional testing methods tend to generate test suite for programs of which parameters are basic data types, e.g. integer, real or Boolean. However, there are lots of programs with inputs of complex data types, e.g. array, point or structure, traditional testing methods can’t deal with them. This paper focuses on testing programs with array parameter that is widely used in programming. The difficulties to generate array test suite lie in two reasons. The first reason is that array is composed by several ordered, interactional elements. Thus, we cannot take the array as several independent, isolated elements when generating array test suite. The second one is that we should consider the implicative attributes of array effecting the generation of test suite, e.g. the size of array, or some special elements in array. This paper proposes a new testing method, Extended Combination Testing (ECT), to generate array test suite systemically. Through based on traditional combination testing, ECT extends its application scope form basic data test suite generation to array test suite generation. ECT proceeds in three steps: (1) yield values of other non-array parameters and spawn them to a proper combination; (2) identify the implicative attributes of array; (3) choose values for each array elements, and combine values of array elements with proper combination coverage into test suite. While in traditional combination test, only step (3) is included. The results of our experiment validate the effectiveness of ECT in generating array test suite.
扩展组合测试:生成阵列测试套件
传统的测试方法倾向于为参数为基本数据类型的程序生成测试套件,如整数、实数或布尔值。然而,有很多程序的输入是复杂的数据类型,如数组、点或结构,传统的测试方法无法处理它们。本文主要研究在程序设计中应用广泛的数组参数测试程序。生成数组测试套件的困难在于两个原因。第一个原因是数组由几个有序的、相互作用的元素组成。因此,在生成数组测试套件时,我们不能将数组作为几个独立的、孤立的元素。第二,我们应该考虑数组的隐含属性影响测试套件的生成,例如数组的大小,或者数组中的一些特殊元素。本文提出了一种新的测试方法——扩展组合测试(ECT),以系统地生成阵列测试套件。ECT在传统组合测试的基础上,将其应用范围从基本数据测试套件生成扩展到阵列测试套件生成。ECT分三步进行:(1)生成其他非数组参数的值,并生成合适的组合;(2)识别阵列隐含属性;(3)为每个数组元素选择值,并将组合覆盖率合适的数组元素值组合到测试套件中。而在传统的组合试验中,只包括步骤(3)。实验结果验证了ECT在阵列测试套件生成中的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信