Radiation Testing and Characterization of the TPS50601A-SP Radiation Hardened Buck Converter

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI:10.1109/RADECS45761.2018.9328718

H. Torres, J. Cruz-Colon, V. Narayanan, J. Valle, R. Baumann

引用次数: 0

Abstract

Single Events Effect (SEE) and Total Ionizing Dose (TID) characterization results for the new TPS50601A-SP, 6 A, DC-DC converter from Texas Instruments are presented. The TPS50601A-SP is Radiation Hardness Assured (RHA) up to a TID=100 krad (Si) for HDR and LDR and SEL-SEB-SEGR free up to LETEFF=75 MeV-cm²/mg. SET's were characterized up to LETEFF=65 MeV-cm²/mg.

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TPS50601A-SP抗辐射降压变换器的辐射测试与特性

介绍了德州仪器公司新型TPS50601A-SP, 6 A DC-DC变换器的单事件效应(SEE)和总电离剂量(TID)表征结果。TPS50601A-SP是辐射硬度保证(RHA)高达TID=100克拉(Si)的HDR和LDR和SEL-SEB-SEGR自由高达LETEFF=75 MeV-cm2/mg。SET的特征值高达LETEFF=65 MeV-cm2/mg。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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