Review of IEEE Std. 1720-2012: “Recommended Practice for Near-Field Antenna Measurements”

L. Foged, V. Rodriguez, J. Fordham, V. Monebhurrun
{"title":"Review of IEEE Std. 1720-2012: “Recommended Practice for Near-Field Antenna Measurements”","authors":"L. Foged, V. Rodriguez, J. Fordham, V. Monebhurrun","doi":"10.1109/cama.2018.8530581","DOIUrl":null,"url":null,"abstract":"The IEEE Standards Association Standards Board (IEEE-SASB) approved the IEEE Std 1720™ “Recommended Practice for Near Field Antenna Measurements” in 2012 [1]. More than fourty dedicated people from industry, academia and other institutions contributed to the creation of this new document. The main motivation for a new standard dedicated to near-field measurements was to complement the existing IEEE Std 149-1979™ “Test Procedures for Antennas” [2].","PeriodicalId":112989,"journal":{"name":"2018 IEEE Conference on Antenna Measurements & Applications (CAMA)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Conference on Antenna Measurements & Applications (CAMA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/cama.2018.8530581","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The IEEE Standards Association Standards Board (IEEE-SASB) approved the IEEE Std 1720™ “Recommended Practice for Near Field Antenna Measurements” in 2012 [1]. More than fourty dedicated people from industry, academia and other institutions contributed to the creation of this new document. The main motivation for a new standard dedicated to near-field measurements was to complement the existing IEEE Std 149-1979™ “Test Procedures for Antennas” [2].
IEEE标准1720-2012:“近场天线测量的推荐实践”
IEEE标准协会标准委员会(IEEE- sasb)于2012年批准了IEEE标准1720™“近场天线测量推荐实践”[1]。来自工业界、学术界和其他机构的40多位热心人士为这份新文件的编写做出了贡献。制定一个专门用于近场测量的新标准的主要动机是补充现有的IEEE Std 149-1979™“天线测试程序”[2]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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