A 160×120 ROIC with Non-uniformity Calibration for Silicon Diode Uncooled IRFPA

Yajun Zhu, Yuze Niu, Wengao Lu, Zhaofeng Huang, Yacong Zhang, Zhongjian Chen
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引用次数: 3

Abstract

This paper presents a ROIC (Readout Integrated Circuit) with NUC (Non-uniformity Calibration), which is applied in a silicon diode uncooled IRFPA (Infrared Focal Plane Array). We propose blind pixel to calibrate chip temperature non-uniformity and DAC-based calibration for calibrating process non-uniformity. The ROIC is fabricated using a $0.35\mu \mathrm{m}$ CMOS process with array size of $160\times 120$. Power consumption of the ROIC is 41mW, noise of the DAC is less than 2$\mu$V, and the circuit’s SNR (Signal-to-Noise Ratio) is 72dB.
一种具有非均匀性校正的160×120 ROIC用于硅二极管非冷却IRFPA
提出了一种应用于硅二极管非冷却红外焦平面阵列的非均匀性校正读出集成电路(ROIC)。我们提出了用盲像素来校准芯片温度不均匀性和基于dac的校准方法来校准过程不均匀性。该ROIC采用$0.35\mu \ mathm {m}$ CMOS工艺制造,阵列尺寸为$160\ × 120$。ROIC功耗为41mW, DAC噪声小于2 μ V,电路信噪比为72dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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