Very-high Q microwave resonances in trapped /sup 171/Yb/sup +/ ions: application as a microwave frequency standard

P. Fisk, M. Lawn, C. Coles, A. Mann, D.G. Blair
{"title":"Very-high Q microwave resonances in trapped /sup 171/Yb/sup +/ ions: application as a microwave frequency standard","authors":"P. Fisk, M. Lawn, C. Coles, A. Mann, D.G. Blair","doi":"10.1109/CPEM.1994.333303","DOIUrl":null,"url":null,"abstract":"The 12.6 GHz microwave resonance in /sup 171/Yb/sup +/ ions confined in a linear Paul trap is interrogated using a cryogenic sapphire resonator-based microwave source. Line Q factors of up to 1.1/spl times/10/sup 13/ have been observed. We report on the performance of the ion trap-sapphire resonator system as a prototype 12.6 GHz frequency standard.<<ETX>>","PeriodicalId":388647,"journal":{"name":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Conference on Precision Electromagnetic Measurements Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1994.333303","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The 12.6 GHz microwave resonance in /sup 171/Yb/sup +/ ions confined in a linear Paul trap is interrogated using a cryogenic sapphire resonator-based microwave source. Line Q factors of up to 1.1/spl times/10/sup 13/ have been observed. We report on the performance of the ion trap-sapphire resonator system as a prototype 12.6 GHz frequency standard.<>
捕获/sup 171/Yb/sup +/离子中的高Q微波共振:作为微波频率标准的应用
利用基于低温蓝宝石谐振器的微波源,研究了线性保罗阱中/sup 171/Yb/sup +/离子的12.6 GHz微波共振。已观察到线Q因子高达1.1/spl倍/10/sup 13/。我们报道了离子阱-蓝宝石谐振器系统作为12.6 GHz频率标准的原型的性能
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信