Using SSDE for USB2.0 conformance co-verification

T. Omnés, Gerard Postuma, Jos Verhaegh, M. Boonen, Nick Gatherer
{"title":"Using SSDE for USB2.0 conformance co-verification","authors":"T. Omnés, Gerard Postuma, Jos Verhaegh, M. Boonen, Nick Gatherer","doi":"10.1109/MEMCOD.2003.1210096","DOIUrl":null,"url":null,"abstract":"Keeping up with the increase in system design complexity requires the deployment of extensive engineering re-use technologies, so-called platform-based design techniques (Chang et al., 1999). When creating derivatives of such a complex systems-on-chip (SOC) platform, verification represents 70% of the overall cost. In this process, functional verification has become a huge obstacle. Engineers are assumed to know how to ensure conformance to an ambiguous specification by developing a million test vectors, which may represent only 50 milliseconds of real-time operation underlines Bob Payne, CTO Philips Semiconductors US (Scott et al., 2001). Moreover, software is playing an increasing if not dominant role especially in this platform derivative game, resulting in a burning need for a software and hardware functional co-verification solution at the integrated SOC level but also in the early intellectual property (IP) development cycles. In this paper we illustrate the use of SSDE for USB2.0 conformance co-verification.","PeriodicalId":213762,"journal":{"name":"First ACM and IEEE International Conference on Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"First ACM and IEEE International Conference on Formal Methods and Models for Co-Design, 2003. MEMOCODE '03. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMCOD.2003.1210096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Keeping up with the increase in system design complexity requires the deployment of extensive engineering re-use technologies, so-called platform-based design techniques (Chang et al., 1999). When creating derivatives of such a complex systems-on-chip (SOC) platform, verification represents 70% of the overall cost. In this process, functional verification has become a huge obstacle. Engineers are assumed to know how to ensure conformance to an ambiguous specification by developing a million test vectors, which may represent only 50 milliseconds of real-time operation underlines Bob Payne, CTO Philips Semiconductors US (Scott et al., 2001). Moreover, software is playing an increasing if not dominant role especially in this platform derivative game, resulting in a burning need for a software and hardware functional co-verification solution at the integrated SOC level but also in the early intellectual property (IP) development cycles. In this paper we illustrate the use of SSDE for USB2.0 conformance co-verification.
使用SSDE进行USB2.0一致性协同验证
为了跟上系统设计复杂性的增加,需要部署广泛的工程重用技术,即所谓的基于平台的设计技术(Chang et al., 1999)。当创建这种复杂的片上系统(SOC)平台的衍生产品时,验证占总成本的70%。在此过程中,功能验证成为一个巨大的障碍。工程师被认为知道如何通过开发一百万个测试向量来确保符合模糊的规范,这可能只代表50毫秒的实时操作,飞利浦半导体美国首席技术官Bob Payne强调(Scott等人,2001年)。此外,特别是在这个平台衍生游戏中,软件正在发挥越来越重要的作用,导致在集成SOC级别以及早期知识产权(IP)开发周期中对软件和硬件功能协同验证解决方案的迫切需求。在本文中,我们演示了使用SSDE进行USB2.0一致性协同验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信