Evaluation of Wavefront Sensors Based on Etched Microlenses

Abstract

Since etched microlenses are produced by digital technology, it is inherently easy to fabricate optics customized for a particular application. However, optimization of wavefront sensors requires an ability to predict their complex behavior. In previous work,1,2 we demonstrated binary microlens arrays for wavefront sensing in a visible wavelength tomographic imaging system. An eight-view tomographic system based on microlens array sensors is now operational and is described in a separate paper at this conference.3 The current paper addresses error budgeting and optimal design for wavefront sensors; it describes modeling and test procedures and illustrates one design approach.