Rethinking thermal via planning with timing-power-temperature dependence for 3D ICs

Kan Wang, Yuchun Ma, Sheqin Dong, Yu Wang, Xianlong Hong, J. Cong
{"title":"Rethinking thermal via planning with timing-power-temperature dependence for 3D ICs","authors":"Kan Wang, Yuchun Ma, Sheqin Dong, Yu Wang, Xianlong Hong, J. Cong","doi":"10.1109/ASPDAC.2011.5722195","DOIUrl":null,"url":null,"abstract":"Due to the increased power density and lower thermal conductivity, 3D is faced with heat dissipation and temperature problem seriously. Previous researches show that leakage power and delay are both relevant to temperature. The timing-power-temperature dependence will potentially negate the performance improvement of 3D designs. TSV (Through-Silicon-Vias) has been shown as an effective way to help heat removal, but they create routing congestions. Therefore, how to reach the trade-off between temperature, via number and delay is required to be solved. Different from previous works on TSV planning which ignored the effects of leakage power, in this paper, we integrate temperature-leakage-timing dependence into thermal via planning of 3D ICs. A weighted via insertion approach, considering both performance and heat dissipation with resource constraint, is proposed to achieve the best balance among delay, via number and temperature. Experiment results show that, with leakage power and resource constraint considered the temperature and via number required can be quite different, and weighted TSV insertion approach can improve thermal via number, by about 5.6%.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

Due to the increased power density and lower thermal conductivity, 3D is faced with heat dissipation and temperature problem seriously. Previous researches show that leakage power and delay are both relevant to temperature. The timing-power-temperature dependence will potentially negate the performance improvement of 3D designs. TSV (Through-Silicon-Vias) has been shown as an effective way to help heat removal, but they create routing congestions. Therefore, how to reach the trade-off between temperature, via number and delay is required to be solved. Different from previous works on TSV planning which ignored the effects of leakage power, in this paper, we integrate temperature-leakage-timing dependence into thermal via planning of 3D ICs. A weighted via insertion approach, considering both performance and heat dissipation with resource constraint, is proposed to achieve the best balance among delay, via number and temperature. Experiment results show that, with leakage power and resource constraint considered the temperature and via number required can be quite different, and weighted TSV insertion approach can improve thermal via number, by about 5.6%.
基于时间-功率-温度依赖性的三维集成电路热规划的反思
由于功率密度的增加和导热系数的降低,3D技术面临着严重的散热和温度问题。以往的研究表明,泄漏功率和延迟都与温度有关。时间-功率-温度依赖关系将潜在地否定3D设计的性能改进。TSV (Through-Silicon-Vias)已被证明是一种有效的散热方法,但它们会造成线路堵塞。因此,如何在温度、通孔数和时延之间达到平衡是需要解决的问题。不同于以往的TSV规划忽略了泄漏功率的影响,本文通过对3D集成电路的规划,将温度泄漏时序的依赖关系纳入热分析。提出了一种在资源约束下兼顾性能和散热的加权插卡方法,以达到时延、插卡数和温度之间的最佳平衡。实验结果表明,在考虑泄漏功率和资源约束的情况下,所需的温度和通孔数可能会有较大差异,加权TSV插入方法可以提高热通孔数,约为5.6%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信