{"title":"High energy density capacitor dielectric mismatch and aging characteristics","authors":"W. Khachen, J. Suthar, J. Laghari, W. J. Sarjeant","doi":"10.1109/IPSS.1992.281977","DOIUrl":null,"url":null,"abstract":"The aging characteristics of two high energy density capacitor dielectric films, polypropylene and polyvinylidene fluoride, with transformer oil and glycerine as dielectric fluids, were obtained using the step-stress test. The inverse power law was used in the analysis of the experimental data. With the value of power exponent determined from the step-stress for each dielectric film/fluid combination, an equivalent constant stress lifetime was estimated for the two configurations tested, with and without a void in the middle layer. The results show that lifetime was longer for the matching dielectric film/fluid combination. Also, the lifetime and the breakdown strength ratio was significantly reduced for the dielectric film/fluid mismatch, especially in the presence of a void.<<ETX>>","PeriodicalId":178146,"journal":{"name":"IEEE 35th International Power Sources Symposium","volume":"12 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 35th International Power Sources Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPSS.1992.281977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The aging characteristics of two high energy density capacitor dielectric films, polypropylene and polyvinylidene fluoride, with transformer oil and glycerine as dielectric fluids, were obtained using the step-stress test. The inverse power law was used in the analysis of the experimental data. With the value of power exponent determined from the step-stress for each dielectric film/fluid combination, an equivalent constant stress lifetime was estimated for the two configurations tested, with and without a void in the middle layer. The results show that lifetime was longer for the matching dielectric film/fluid combination. Also, the lifetime and the breakdown strength ratio was significantly reduced for the dielectric film/fluid mismatch, especially in the presence of a void.<>