An alytical modeling of response time and full well capacity of a pinned photo diode

K. Akshay, P. R. Pillai, B. Bhuvan
{"title":"An alytical modeling of response time and full well capacity of a pinned photo diode","authors":"K. Akshay, P. R. Pillai, B. Bhuvan","doi":"10.1109/DTIS.2018.8368568","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a time based approach to explain the behavior of a pinned photo diode both in intrinsic and extrinsic mode of operation. Based on this approach, analytical models for the response time and full well capacity are derived. The models show good agreement with the TCAD simulations. Further, the models derived are heavily dependent on the photocurrent parameter. So, the sensitivity of photocurrent to doping variations of the pinned photodiode for different junction depths is also studied with the help of TCAD simulations.","PeriodicalId":328650,"journal":{"name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2018.8368568","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

In this paper, we propose a time based approach to explain the behavior of a pinned photo diode both in intrinsic and extrinsic mode of operation. Based on this approach, analytical models for the response time and full well capacity are derived. The models show good agreement with the TCAD simulations. Further, the models derived are heavily dependent on the photocurrent parameter. So, the sensitivity of photocurrent to doping variations of the pinned photodiode for different junction depths is also studied with the help of TCAD simulations.
钉住式光电二极管响应时间和满阱容量的分析模型
在本文中,我们提出了一种基于时间的方法来解释一个固定的光电二极管在内在和外在工作模式下的行为。基于该方法,推导了响应时间和满井产能的分析模型。模型与TCAD仿真结果吻合较好。此外,导出的模型严重依赖于光电流参数。因此,本文还借助TCAD仿真研究了不同结深下钉住光电二极管掺杂变化对光电流的敏感性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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