Fast dependence analysis in a multimedia vectorizing compiler

P. Bulić, V. Gustin
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引用次数: 1

Abstract

There are a number of data dependence tests that have been proposed in the literature. In each test there is a different trade-off between accuracy and efficiency. The most widely used approximate data dependence tests are the Banerjee inequality and the GCD test; whereas the Omega test is a well-known exact data dependence test. We consider parallelization for microprocessors with a multimedia extension (the short SIMD execution model). For the short SIMD parallelism extraction it is essential that, if dependency exists, then the dependence distance is greater than or equal to the number of data processed in the SIMD register. This implies that some loops that could not be vectorized on traditional vector processors can still be parallelized for the short SIMD execution. In all of these tests the parallelization would be prohibited when actually there is no parallelism restriction relating to the short SIMD execution model. We present a new, fast data dependence test for array references with linear subscripts, which is used in a vectorizing compiler for microprocessors with a multimedia extension. Our test is suitable for use in a dependence analyser that is organized as a series of tests, progressively increasing in accuracy, as a replacement for the GCD or Banerjee tests.
多媒体矢量化编译器的快速依赖分析
文献中提出了许多数据依赖性测试。在每个测试中,在准确性和效率之间都有不同的权衡。最广泛使用的近似数据依赖检验是Banerjee不等式和GCD检验;而Omega检验是一个众所周知的精确数据依赖检验。我们考虑具有多媒体扩展(短SIMD执行模型)的微处理器的并行化。对于短SIMD并行性提取,如果存在依赖性,则依赖性距离大于或等于SIMD寄存器中处理的数据数是至关重要的。这意味着一些不能在传统矢量处理器上矢量化的循环仍然可以在短时间的SIMD执行中并行化。在所有这些测试中,当实际上没有与短SIMD执行模型相关的并行性限制时,并行化将被禁止。我们提出了一种新的、快速的线性下标数组引用的数据依赖性测试方法,并将其用于具有多媒体扩展的微处理器向量化编译器中。我们的测试适用于作为一系列测试组织的依赖分析器,其准确性逐渐增加,作为GCD或Banerjee测试的替代品。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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