{"title":"A counterexample-based debugging method for reconfigurable single-electron transistor arrays","authors":"Wenjiao Zeng, Siyi Liu, Yu-Da Chen, Yung-Chih Chen","doi":"10.1109/EDSSC.2017.8126417","DOIUrl":null,"url":null,"abstract":"This paper proposes an automatic debugging method for single-electron transistor arrays. The method iteratively calls a SAT solver to find a counterexample and identify errors based on the counterexample. It can fix an incorrect SET array which can be corrected by changing an edge's configuration. The experimental results show that the proposed debugging method is efficient and effective. It finds all the possible corrections for an incorrect SET array within an average of 0.021 seconds.","PeriodicalId":163598,"journal":{"name":"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2017.8126417","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper proposes an automatic debugging method for single-electron transistor arrays. The method iteratively calls a SAT solver to find a counterexample and identify errors based on the counterexample. It can fix an incorrect SET array which can be corrected by changing an edge's configuration. The experimental results show that the proposed debugging method is efficient and effective. It finds all the possible corrections for an incorrect SET array within an average of 0.021 seconds.