Optical Properties of Multilayer Thin-Film Interference Filters

Abstract

The spectral properties of multilayer interference systems produced by multiple repeating of symmetric tree-component period, especially, the tree-component construction of dielectric thin films and the types of dielectric-metal-dielectric systems, were investigation. These thin films structures can be used as infrared interference filters as well as a standard for calibration of different spectral devises. The transmission and reflection analysis of these systems using matrix method was conducted. The obtained results allow to select systems with spectral characteristics that fit with applied problems