A. Jiménez, G. Bueno, G. Cristóbal, O. Deniz, David Toomey, C. Conway
{"title":"Image quality metrics applied to digital pathology","authors":"A. Jiménez, G. Bueno, G. Cristóbal, O. Deniz, David Toomey, C. Conway","doi":"10.1117/12.2230655","DOIUrl":null,"url":null,"abstract":"Several full-reference and blind metrics from literature have been tested on a set of digitized pathology slides under different known distortion conditions. Those ones showing the most uniform behavior are presented in this paper. Also, an algorithm that provides a blur map of the whole slide images (WSIs) has been implemented based on one of such methods.","PeriodicalId":285152,"journal":{"name":"SPIE Photonics Europe","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Photonics Europe","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2230655","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
Several full-reference and blind metrics from literature have been tested on a set of digitized pathology slides under different known distortion conditions. Those ones showing the most uniform behavior are presented in this paper. Also, an algorithm that provides a blur map of the whole slide images (WSIs) has been implemented based on one of such methods.