Accelerated Aging Test for Laser Diodes

Abstract

This article evaluates the lifetime of laser diodes using an accelerated test program. Due to the very long lifetime of the laser diode, it is impractical to test it under normal conditions; for this, accelerated aging of the product at higher temperatures is used. The Arrhenius model is used to estimate MTBF. The article provides statistical measurement data and calculated values of the laser diode lifetime.