{"title":"PathART: path-sensitive adaptive random testing","authors":"Shan-Shan Hou, Chun Zhang, Dan Hao, Lu Zhang","doi":"10.1145/2532443.2532460","DOIUrl":null,"url":null,"abstract":"As test data widely spreading on the input domain may not thoroughly test the program's logic, in this paper, we propose an approach to generating test data widely spreading on a program's execution paths. In particular, we analyze execution paths of the program, distill constraints for executing the paths, calculate the path distance between test data according to their satisfaction for paths' constraints, and then generate test data far away from each other based on their path distance. The experimental results show that our approach significantly reduces the number of test data generated before the first fault is found.","PeriodicalId":362187,"journal":{"name":"Proceedings of the 5th Asia-Pacific Symposium on Internetware","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 5th Asia-Pacific Symposium on Internetware","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2532443.2532460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
As test data widely spreading on the input domain may not thoroughly test the program's logic, in this paper, we propose an approach to generating test data widely spreading on a program's execution paths. In particular, we analyze execution paths of the program, distill constraints for executing the paths, calculate the path distance between test data according to their satisfaction for paths' constraints, and then generate test data far away from each other based on their path distance. The experimental results show that our approach significantly reduces the number of test data generated before the first fault is found.