Lockheed Martin ATE's Support Automatic Test-Markup Language (ATML) 1671.1 and 1641

Abstract

The design of modern Automated Test Equipment (ATE) is now being enabled to support the IEEE standards for ATML. These standards are IEEE 1671.1 (Test Description) and 1641 (Signal and Test Definition). The critical task is now defining the processes to develop and support the Test Program Sets to ensure they follow the standards. This is feasible by using existing commercial tools that allow creating System Model Language (SysML®) and generating ATML Test Description (ATML 1671.1) and Signals (ATML 1641) that define the test and signals expected to be present in the TPS. Conversion tools are then used to generate NI TestStand™ sequences based on the test and signals defined in the ATML Test Description. Once developed, the TPS must be validated to submit or load on the designated ATE. Using this process, we recommend following a TPS style guide to fully benefit the capabilities and features of the ATE Test Executive. The objective of this paper is to show the process and steps taken to create and ATML compliant TPS with the proper validation for submitting it to a designated ATE platform.