Study of residual VNA measurement errors due to imperfect Thru-Reflect-Match calibration standards

Jarosław Szatkowski, W. Wiatr
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引用次数: 1

Abstract

We report results of our detailed study on vector-network-analyzer measurement errors after the TRM (Thru-Reflect-Match) calibration performed with imperfect SMA-connectorized standards at frequencies from 0.1 to 18 GHz. These residual errors are caused by an asymmetry of a thru/line standard and a load mismatch. To remove errors of the first type, we introduce a novel simple technique of the thru/line symmetrization, which utilizes an additional measurement of the same standard, but reversely connected to the VNA ports. To extract the load mismatch errors, we apply the multiline TRL (Thru-Reflect-Line) calibration as a reference one. To this end we use three common barrels of different lengths acting after their symmetrization as transmission line standards. With the VNA calibrated using the multiline TRL method, we characterize our mismatched load and then utilize its data to our modified TRM calibration. We show that this simple and low-cost approach results in improved accuracy of the TRM calibration. This aproach may be easily applied to enhance accuracy of the industrial VNA measurements on SMA devices.
通反射匹配校准标准不完善导致的VNA测量误差研究
我们报告了在0.1至18 GHz频率范围内使用不完善的sma连接标准进行TRM(透反射匹配)校准后矢量网络分析仪测量误差的详细研究结果。这些残余误差是由通/线标准的不对称和负载不匹配引起的。为了消除第一种类型的误差,我们引入了一种新颖的简单的直通/线路对称技术,它利用了相同标准的额外测量,但反向连接到VNA端口。为了提取负载失配误差,我们采用多线TRL(透反射线)校准作为参考。为此,我们采用三个不同长度的普通桶在对称后作为传输线标准。通过使用多线TRL方法校准VNA,我们对失配负载进行了表征,然后将其数据用于改进的TRM校准。我们证明了这种简单和低成本的方法可以提高TRM校准的精度。这种方法可以很容易地应用于提高SMA器件上工业VNA测量的精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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