Experimental study of water absorption of electronic components and internal local temperature and humidity into electronic enclosure

Hélène Conseil, M. Jellesen, R. Ambat
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引用次数: 19

Abstract

Corrosion reliability of electronic products is a key factor for electronics industry, and today there is a large demand for performance reliability in large spans of temperature and humidity during day and night shifts. Corrosion failures are still seen due to the effects of temperature, humidity and corrosion accelerating species in the atmosphere, and moreover the surface region of printed circuit board assemblies is often contaminated by various contaminating species. In order to evaluate the level of humidity at which failures such as electrochemical migration start to appear on printed circuit board assemblies, a study of combined electric field, hygroscopic contamination and humidity on inter-digitated test comb patterns contaminated with sodium chloride and further exposed to increasing humidity has been performed. Results showed a significant increase in leakage current when only 70-75 % RH was reached, corresponding to the deliquescence relative humidity level of NaCl. The overall effect of climate (humidity and temperature) has been studied on the internal climate of typical electronic enclosures. The varied parameters included material used for casing, s ize of opening, differential humidity, and temperature effects simulating day/night, and the use of desiccants.
电子元件的吸水率与电子外壳内部局部温度和湿度的实验研究
电子产品的腐蚀可靠性是影响电子工业发展的关键因素,在白班和夜班大范围的温度和湿度下,对电子产品的腐蚀可靠性有很大的要求。由于大气中的温度、湿度和腐蚀加速物质的影响,仍然可以看到腐蚀失效,而且印刷电路板组件的表面区域经常受到各种污染物质的污染。为了评估在湿度水平下印刷电路板组件上开始出现电化学迁移等故障,对被氯化钠污染并进一步暴露于增加湿度的数字化测试梳型进行了联合电场、吸湿性污染和湿度的研究。结果表明,当相对湿度达到70- 75%时,泄漏电流显著增加,对应于NaCl的潮解相对湿度水平。本文研究了气候(湿度和温度)对典型电子机箱内部气候的总体影响。不同的参数包括用于套管的材料,开口的大小,不同的湿度,模拟白天/夜晚的温度效应,以及干燥剂的使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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