On Symmetry Properties of Distributed Resistive Structures

Abstract

In this paper we present some results obtained in the study of symmetry properties of resistive distributed microelectronic structures. Although these structures present many properties similar with those obtained using classical lumped resistive networks, some specific aspects based on their bidimensional structure are studied. A very particular case, named 'complete symmetrical' structure introduced before is presented and its equivalent matrix parameters are computed based on its symmetry properties only. The results were used for comparison with the results already obtained by authors in the analysis and synthesis of these structures. However these results are useful for comparison in other similar problems too.