Quantitative modelling of resonant PL in InGaN SQW-LED structure

M. Sabathil, A. Laubsch, N. Linder
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Abstract

The measurement of bias and temperature dependent photoluminescence, photocurrent and their decay times allows to deduce important physical properties such as barrier height, electron-hole overlap and the magnitude of the piezoelectric field in InGaN quantum wells. However the analysis of these experiments demands for a detailed physical model based on a realistic device structure which is able to predict the measured quantities. In this work a self-consistent model is presented based on a realistic description of the alloy and doping profile of a green InGaN single quantum well light emitting diode. The model succeeds in the quantitative prediction of the quantum confined Stark shift and the associated change in the electron-hole overlap measured via the change in the bimolecular decay rate using literature parameters for the piezoelectric constants. The blue shift of the emission under forward current conditions can be attributed to the carrier induced screening of the piezoelectric charges as predicted by the model.
InGaN SQW-LED结构中谐振PL的定量建模
通过测量偏置和温度相关的光致发光、光电流及其衰减时间,可以推断出InGaN量子阱中重要的物理性质,如势垒高度、电子-空穴重叠和压电场的大小。然而,这些实验的分析需要一个基于实际器件结构的详细物理模型,该模型能够预测测量量。在本工作中,基于对绿色InGaN单量子阱发光二极管的合金和掺杂谱的实际描述,提出了一个自洽模型。该模型成功地定量预测了量子受限斯塔克位移和相关的电子-空穴重叠的变化,这些变化是通过双分子衰减率的变化来测量的,使用文献参数来表示压电常数。在正向电流条件下,发射的蓝移可以归因于模型预测的压电电荷的载流子诱导筛选。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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