General Methodologies for Assessing EMI/EMC in Complex Electronic Circuits and Systems

Abstract

This paper introduces the procedures for utilizing two techniques, namely Fault Tree Analysis (FTA) and Electromagnetic Effects Criticality Analysis (EMECA), for assessing EMI/EMC in complex electronic circuits and systems. Application of these techniques are demonstrated by means of examples where, because of the use of digital, high-speed, high-density integrated circuit technologies, EMI/EMC assessments by traditional deterministic methods are inappropriate. The results illustrate the probability of achieving EMC while accounting for the statistical nature of EMI.