High frequency measurements and simulations on wire-bonded modules on the sequential build-up boards (SBU)

R. Sihlbom, M. Dernevik, M. Lindgren, P. Starski, Z. Lai, J. Liu
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引用次数: 1

Abstract

This paper gives results from HF measurements and simulation of sequential build-up boards (SBU). An HF test pattern was designed to investigate SBU HF properties. SBUs were supplied by four manufacturers. The test SBUs contained patterns for crosstalk, impedance matching, stray capacitance and wire bonding. The boards had a double-sided FR-4 core with two built-up layers on each side, but the HF test board was only on one side. Test patterns were located in layers five and six. Two line spacings between signal and victim tracks of 50 /spl mu/m and 100 /spl mu/m were considered. S-parameters were measured on a network analyser in the 45 MHz-10 GHz range. In time domain test, near-end and far-end responses were measured. Simulations used P-SPICE, HP MDS and a 2D finite difference program. Impedance measurements and simulations were performed in layers five and six with conductor widths for 50 /spl Omega/ and 55 /spl Omega/ characteristic impedances. Line widths ranged from 40-65 /spl mu/m in layer five and 150-200 /spl mu/m in layer six. Reference tracks were designed to estimate conductor and dielectric loss. In the wire-bonding test, two interconnect types were assessed: a solder joint and an isotropically conductive adhesive joint (ICA). A Si test chip was used for wire-bonding on the SBU-board. Crosstalk measurements and simulations agreed closely over 45 MHz-10 GHz. Small differences between the three dielectrics were obtained, and dielectric loss is a limiting factor in the HF range. For a test pattern length of 30 mm, the HF limit (-3 dB transmission loss), was 2-3 GHz in layer six and 3-4 GHz in layer five. Measured characteristic impedances ranged from 44-63 /spl Omega/.
顺序叠加板(SBU)上线键模块的高频测量与仿真
本文给出了顺序叠加板(SBU)的高频测量和仿真结果。设计了高频测试图来研究SBU的高频特性。SBUs由四家制造商提供。测试SBUs包含串扰、阻抗匹配、杂散电容和线键合的模式。电路板有一个双面的FR-4核心,每侧有两个堆叠层,但高频测试板只在一侧。测试模式位于第五层和第六层。考虑信号和受害者轨道之间的两条线间距为50 /spl mu/m和100 /spl mu/m。s参数在45 MHz-10 GHz范围的网络分析仪上测量。在时域测试中,测量近端和远端响应。仿真采用P-SPICE、HP MDS和二维有限差分程序。阻抗测量和模拟在第5层和第6层进行,导体宽度分别为50 /spl ω /和55 /spl ω /特征阻抗。第五层线宽为40 ~ 65条/亩,第六层线宽为150 ~ 200条/亩。设计了参考轨道来估计导体和介电损耗。在线粘接测试中,评估了两种互连类型:焊点和各向同性导电胶粘接(ICA)。采用Si测试芯片在sbu板上进行线接。在45 MHz-10 GHz范围内,串扰测量和模拟结果非常接近。三种介质之间的差异很小,介质损耗是高频范围内的限制因素。对于长度为30 mm的测试模式,第6层的HF极限(-3 dB传输损耗)为2-3 GHz,第5层为3-4 GHz。测量的特征阻抗范围为44-63 /spl ω /。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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