P. Arcioni, R. Castello, L. Perregrini, E. Sacchi, F. Svelto
{"title":"An improved lumped-element equivalent circuit for on silicon integrated inductors","authors":"P. Arcioni, R. Castello, L. Perregrini, E. Sacchi, F. Svelto","doi":"10.1109/RAWCON.1998.709196","DOIUrl":null,"url":null,"abstract":"This paper presents an improved lumped-element equivalent circuit of silicon integrated inductors, that accurately describes the effect on the Q-factor of the electromagnetic coupling between the metal strips and the substrate. In the proposed model a magnetic coupling describes the interaction between the substrate and the spirals of metal. The equivalent circuit is extracted using a characterization procedure that, from two-port wide-band measurement of the S-parameters, automatically yields the value of the lumped-element via the method of least square minima.","PeriodicalId":226788,"journal":{"name":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings RAWCON 98. 1998 IEEE Radio and Wireless Conference (Cat. No.98EX194)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAWCON.1998.709196","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
This paper presents an improved lumped-element equivalent circuit of silicon integrated inductors, that accurately describes the effect on the Q-factor of the electromagnetic coupling between the metal strips and the substrate. In the proposed model a magnetic coupling describes the interaction between the substrate and the spirals of metal. The equivalent circuit is extracted using a characterization procedure that, from two-port wide-band measurement of the S-parameters, automatically yields the value of the lumped-element via the method of least square minima.