{"title":"A method for topology conformance tests under logical constraints","authors":"Jianwu Zhang, Guoai Xu, Yixian Yang, Shize Guo","doi":"10.1109/WCINS.2010.5541805","DOIUrl":null,"url":null,"abstract":"Common Criteria(CC) provides only the standard for evaluating information security product or system. Conformance test is considered from a statistical point of view, while the determination of whether the topology is consistent with the standard depends on a conformance test. CC based topology conformance test is in trouble without an effective method. In this paper, a method for topology conformance test was presented and an algorithm for topology conformance test under logical constraints was introduced. In our method, the topology is described by a matrix and the logical constraints are stored using Binary Decision Diagrams (BDDs) data structure. From the experimental results, we can see the method is efficient enough for topology conformance test.","PeriodicalId":156036,"journal":{"name":"2010 IEEE International Conference on Wireless Communications, Networking and Information Security","volume":"109 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Wireless Communications, Networking and Information Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WCINS.2010.5541805","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Common Criteria(CC) provides only the standard for evaluating information security product or system. Conformance test is considered from a statistical point of view, while the determination of whether the topology is consistent with the standard depends on a conformance test. CC based topology conformance test is in trouble without an effective method. In this paper, a method for topology conformance test was presented and an algorithm for topology conformance test under logical constraints was introduced. In our method, the topology is described by a matrix and the logical constraints are stored using Binary Decision Diagrams (BDDs) data structure. From the experimental results, we can see the method is efficient enough for topology conformance test.
CC (Common Criteria)仅提供评估信息安全产品或系统的标准。一致性测试是从统计的角度考虑的,而确定拓扑是否与标准一致取决于一致性测试。基于CC的拓扑一致性测试由于缺乏有效的方法而陷入困境。提出了一种拓扑一致性测试方法,并介绍了一种逻辑约束下拓扑一致性测试算法。在我们的方法中,拓扑由矩阵描述,逻辑约束使用二进制决策图(bdd)数据结构存储。实验结果表明,该方法对拓扑一致性测试是有效的。