A General Empirical Model of Secondary Electron Yield and Its Application in Monte Carlo Simulation of a Microporous Gold Surface

Abstract

We present a general empirical model of secondary electron yield (SEY), which successfully fits the experimentally measured SEY of a flat gold surface for both normal and oblique incidence of primary electrons. This empirical model is applied in a two-dimensional Monte Carlo (MC) simulation to estimate the effective SEY reduction of a microporous surface. The simulation results are in very good agreement with the experimental data.