Computer-Aided Analysis of RFI Effects in Integrated Circuits

Abstract

The modified Ebers-Moll model for a bipolar junc­ tion transistor has been developed for predicting RFI 1-3 effects in bipolar integrated circuits. In this paper it will be shown that the modified Ebers-Moll model can be used with electronic circuit analysis programs such as SPICE (Simulation Program with Inte­ grated Circuit Emphasis) to provide useful information about RFI effects in digital bipolar integrated 4 circuits.