A high-isolation 60GHz CMOS transmit/receive switch

Chi-Shin Kuo, Hsin-Chih Kuo, H. Chuang, Chu‐Yu Chen, Tzuen-Hsi Huang
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引用次数: 21

Abstract

This paper presents a 60GHz high-isolation CMOS single-pole double-throw (SPDT) transmitter/receiver (T/R) switch fabricated with TSMC standard 90-nm 1P9M CMOS technology. A low insertion loss and high linearity are achieved by using the body-floating technique. The leakage cancellation technique is used to increase the isolation between the transmitter and receiver ports. The top metal (M9) is mainly adopted for designing signal paths and the microstrip-line matching elements. In order to minimize the substrate loss, the first metal (M1) as the ground plane is used in this design. The measured results show the insertion loss from the transmitter port to the antenna port is less than 3.5 dB, and the isolation between the transmitter and receiver ports is higher than 28 dB from 57 to 64GHz. At the center frequency of 60GHz, the port isolation is higher than 34 dB and the input 1-dB compression point (IP1dB) is +6.9 dBm.
高隔离60GHz CMOS发射/接收开关
提出了一种采用台积电标准90纳米1P9M CMOS工艺制造的60GHz高隔离CMOS单极双掷(SPDT)收发开关。采用浮体技术实现了低插入损耗和高线性度。采用漏电消除技术来提高收发端口之间的隔离度。顶部金属(M9)主要用于设计信号路径和微带线匹配元件。为了尽量减少基板损耗,在本设计中采用第一金属(M1)作为接地平面。测量结果表明,从发射端口到天线端口的插入损耗小于3.5 dB,在57 ~ 64GHz范围内,发射端口和接收端口之间的隔离度高于28 dB。在中心频率为60GHz时,端口隔离度高于34 dB,输入1db压缩点(IP1dB)为+6.9 dBm。
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