Failure Analysis of Glass Transition Temperature of LED Insulation Layer

Abstract

With the development of light-emitting diodes (LEDs) technology, the number of LEDs chips in high-power LEDs devices is increasing, and the use of LEDs continues to expand, the reliability has become the key to its widespread use. When the LEDs device fails, the failure analysis of the device can effectively derive the mechanism and condition of the device failure, which has a significant effect on enhancing the reliability of the device. In this paper, by analyzing the instantaneous voltage curve and thermal of the failed device, it can be concluded that when the operating current of the LEDs device is large, due to the poor thermal conductivity of the insulating layer, the insulating layer of the device is in the vitrification transition temperature for a long time. The shape of the insulating layer is easily changed or even burned to cause delamination, resulting in LEDs failure.