Securing IoT Devices Using Robust DRAM PUFs

Abstract

In this work, we present a novel way in which DRAM modules, which are found inherently in many IoT devices, can be used to enhance the security of such devices. We test the robustness of two DRAM-based security primitives, namely DRAM retention-based PUFs and Row Hammer PUFs, to two external factors, i.e., ambient temperature and voltage variations. As both types of PUFs are proven to be highly dependent on temperature, we, then, present and discuss ways in which such PUFs can be used to implement cryptographic applications in a robust way, no longer being affected by temperature variations. Finally, we also present a proof-of-concept robust DRAM PUF-based cryptographic protocol that can be adapted for different security applications. In this way, our work demonstrates a cost-efficient, lightweight and practical manner in which even low-end, resource-constrained IoT devices can be easily protected.